Metrology and Testing

Metrology and Testing

MSAM lab is equipped with an advanced Nano-CT enabling throughput tomographic imaging of AM-made parts. Along with other characterization devices, MSAM is placed in a unique position to conduct thorough process characterization.

Three-dimensional rendering of μCT scans of a sintered sample (1490 °C, 6 h) showing the distributions of (a) pore volume and (b) pore sphericity.

Three-dimensional rendering of μCT scans of a sintered sample (1490 °C, 6 h) showing the distributions of (a) pore volume and (b) pore sphericity.

Orthogonal View comparison between green (left) and sintered (right) state, for a non-densifying sintering regime (up to 1000C), with cross-sections illustrating qualitative view of sample sintering necks between particles.

Orthogonal View comparison between green (left) and sintered (right) state, for a non-densifying sintering regime (up to 1000C), with cross-sections illustrating qualitative view of sample sintering necks between particles.

Surface height map of (a) spatter free (b) spatter rich samples.

Surface height map of (a) spatter free (b) spatter rich samples.

Secondary mode of SEM showing cross-section of single track produced by P=150 (W), V=1000 (mm/s), and layer thickness=60 (µm) with magnification of a) 2000X b) 19,000X c) 18,800X.

Secondary mode of SEM showing cross-section of single track produced by P=150 (W), V=1000 (mm/s), and layer thickness=60 (µm) with magnification of a) 2000X b) 19,000X c) 18,800X.

Visualisation of different phases of the AM-made silicone structure; (a) yellow: silicone powder, blue: cross-linked silicone binder; (b) isolated cross-linked silicone binder; (c) isolated pores; (d) largest interconnected pore networks visualised with d

Visualisation of different phases of the AM-made silicone structure; (a) yellow: silicone powder, blue: cross-linked silicone binder; (b) isolated cross-linked silicone binder; (c) isolated pores; (d) largest interconnected pore networks visualised with d